![]() ![]() ![]() If you would like to try out a free demonstration version email casaxps (at) The results of the data reduction are tabulated then made available in a convenient format for Microsoft products such as Word or Excel.įor more information visit the Casa Software website at Spectra presented in this ISO standard can be viewed, selected and processed in a simple yet powerful way. Although much of the functionality present in CasaXPS is available on the systems that accompany the XPS instruments, CasaXPS offers user-friendly data processing for anyone with a Pentium PC running Microsoft Windows 95 (or later).ĬasaXPS is a data browser for VAMAS (ISO 14976) Surface Chemical Analysis Standard Data Transfer Format. X-ray photoelectron spectroscopy (XPS) is a surface sensitive, non-destructive technique used routinely to analyze the outermost ~10 nm (~30 atomic layers) of natural and engineered materials.Computer Aided Surface Analysis for X-ray Photoelectron Spectroscopy (CasaXPS) has been written for research scientists who routinely work with XPS spectra. XPS is routinely used to determine a) the composition of material surfaces (elemental identification), the relative abundances of these components on surfaces (semi-quantitative analysis), and c) the chemical state of polyvalent ions by measuring the binding energies of elements, which is related to the nature and strength of their chemical bonds. XPS is used to characterize the surfaces of diverse materials such as inorganic compounds (minerals), semiconductors, organic compounds, and thin films and coatings on natural and engineered materials. XPS is used to support research on surface-mediated processes such as sorption, catalysis, redox, dissolution/precipitation, corrosion, and evaporation/deposition type reactions. It is almost always the case that the surface composition and chemistry of materials, measured on the order of a few atomic layers (~10 nm), is different from the "bulk" composition determined by methods such as energy dispersive spectrometry (EDS) with excitation volumes that can extend as much as 3 microns into the material.įundamental Principles of X-Ray Photoelectron Spectroscopy ![]() ![]() Reuse: This item is offered under a Creative Commons Attribution-NonCommercial-ShareAlike license You may reuse this item for non-commercial purposes as long as you provide attribution and offer any derivative works under a similar license. Casa xps peak fitting double intensity of one peak license#Ĭasa xps peak fitting double intensity of one peak license#. ![]()
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